Hoekstra A, Netten H, de Ridder D. Cell nuclei analysis using neural networks. In: Neural Networks: Best practice in Europe. Singapore: SNN; 1997. p. 175-8. (, Pr).
Duin RP, Frietman EE, Hoekstra A, Ligteringen A, de Ridder D, Skurichina M, et al. The use of neural networks tools in statistical pattern recognition. In: Neural Networks: Best Practice in Europe, Proc. SNN'97, Progress in Neural Processing Vol. 8. Singapore: SNN; 1997. p. 165-8.
Hoekstra A, Kraaijveld MA, de Ridder D, Schmidt WF. The Complete SPRLIB & ANNLIB. Pattern Recognition Group, Faculty of Applied Physics, Delft University of Technology; 1996.
de Ridder D, Hoekstra A, Duin RP. Feature extraction in shared weights neural networks. In: Kerckhoffs EJH, Sloot PMA, Tonino JFM, Vossepoel AM, editors. Proc. 2nd Annual Conference of the Advanced School for Computing and Imaging (ASCI'96). Delft, The Netherlands: ASCI; 1996. p. 289-94. Download: asci_96.pdf (183.73 KB)
Hoekstra A, Netten H, de Ridder D. A neural network applied to spot counting. In: Proc. of the 2nd Annual Conference of the Advanced School for Computing and Imaging (ASCI'96). Delft, The Netherlands: ASCI; 1996. p. 224-9.